Study of nanocrystallization process in FeCrCuNbSiB amorphous alloys by Young's modulus measurements

BAYRİ N., ATALAY S., KOLAT V. S., İZGİ T., SOVAK P.

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, vol.17, pp.1372-1378, 2015 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 17
  • Publication Date: 2015
  • Journal Name: JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.1372-1378
  • Inonu University Affiliated: Yes

Abstract

This paper presents the influence of nanocrystallization process on magnetic field dependence of Young's Modulus of Fe74-xCrxCu1Nb3Si13B9 (x=0, 2, 4, 8, 11) alloys. The samples were annealed between 450 degrees C and 600 degrees C for 1 hour under argon atmosphere to induce various nanocrystalline fractions. The variation in the microstructure upon annealing was examined by the X-ray spectrum data. Samples annealed at 500 degrees C or at higher temperature showed nanocrystalline alpha-Fe (Si) phase embedded in amorphous matrix. It was observed that the magnitude of field dependence of Young's modulus varies from 40% to a nearly zero as the saturation magnetostriction is reduced by nano size alpha-Fe(Si) grains. The results are interpreted partly in terms of internal stress relief and reduced magnetostriction in nanocrystalline samples.