Depth-wise Squeeze and Excitation Block-based Efficient-Unet model for surface defect detection


Uzen H., Turkoglu M., Aslan M., HANBAY D.

VISUAL COMPUTER, 2022 (SCI-Expanded) identifier

  • Publication Type: Article / Article
  • Publication Date: 2022
  • Doi Number: 10.1007/s00371-022-02442-0
  • Journal Name: VISUAL COMPUTER
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, Applied Science & Technology Source, Compendex, Computer & Applied Sciences, INSPEC, zbMATH
  • Keywords: Pixel-level surface defects' detection, Convolutional neural network, Depth-wise Squeeze and Excitation Block, Unet, CONVOLUTIONAL NEURAL-NETWORK, VISION SYSTEM, CLASSIFICATION, ALGORITHM, IMAGES
  • Inonu University Affiliated: Yes

Abstract

Detection of surface defects in manufacturing systems is crucial for product quality. Detection of surface defects with high accuracy can prevent financial and time losses. Recently, efforts to develop high-performance automatic surface defect detection systems using computer vision and machine-learning methods have become prominent. In line with this purpose, this paper proposed a novel approach based on Depth-wise Squeeze and Excitation Block-based Efficient-Unet (DSEB-EUNet) for automatic surface defect detection. The proposed model consists of an encoder-decoder, the basic structure of the Unet architecture, and a Depth-wise Squeeze and Excitation Block added to the skip-connection of Unet. First, in the encoder part of the proposed model, low-level and high-level features were obtained by the EfficientNet network. Then, these features were transferred to the Depth-wise Squeeze and Excitation Block. The proposed DSEB based on the combination of Squeeze-Excitation and Depth-wise Separable Convolution enabled to reveal of critical information by weighting the features with a lightweight gating mechanism for surface defect detection. Besides, in the decoder part of the proposed model, the structure called Multi-level Feature Concatenated Block (MFCB) transferred the weighted features to the last layers without losing spatial detail. Finally, pixel-level defect detection was performed using the sigmoid function. The proposed model was tested using three general datasets for surface defect detection. In experimental works, the best F1-scores for MT, DAGM, and AITEX datasets using the proposed DSEB-EUNet architecture were 89.20%, 85.97%, and 90.39%, respectively. These results showed the proposed model outperforms higher performance compared to state-of-the-art approaches.