A. BAYSAR Et Al. , "DIELECTRIC PROPERTY MEASUREMENT OF POLYCRYSTALLINE SILICON AT HIGH-TEMPERATURES," JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY , vol.26, no.3, pp.145-155, 1991
BAYSAR, A. Et Al. 1991. DIELECTRIC PROPERTY MEASUREMENT OF POLYCRYSTALLINE SILICON AT HIGH-TEMPERATURES. JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY , vol.26, no.3 , 145-155.
BAYSAR, A., KUESTER, J., & ELGHAZALY, S., (1991). DIELECTRIC PROPERTY MEASUREMENT OF POLYCRYSTALLINE SILICON AT HIGH-TEMPERATURES. JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY , vol.26, no.3, 145-155.
BAYSAR, AHMET, J KUESTER, And S ELGHAZALY. "DIELECTRIC PROPERTY MEASUREMENT OF POLYCRYSTALLINE SILICON AT HIGH-TEMPERATURES," JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY , vol.26, no.3, 145-155, 1991
BAYSAR, AHMET Et Al. "DIELECTRIC PROPERTY MEASUREMENT OF POLYCRYSTALLINE SILICON AT HIGH-TEMPERATURES." JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY , vol.26, no.3, pp.145-155, 1991
BAYSAR, A. KUESTER, J. And ELGHAZALY, S. (1991) . "DIELECTRIC PROPERTY MEASUREMENT OF POLYCRYSTALLINE SILICON AT HIGH-TEMPERATURES." JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY , vol.26, no.3, pp.145-155.
@article{article, author={AHMET BAYSAR Et Al. }, title={DIELECTRIC PROPERTY MEASUREMENT OF POLYCRYSTALLINE SILICON AT HIGH-TEMPERATURES}, journal={JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY}, year=1991, pages={145-155} }